From 4bbfdc86dc98b890db3d5b9c3456e73cea4767ab Mon Sep 17 00:00:00 2001
From: Kurt Borja <kuurtb@gmail.com>
Date: Tue, 14 Jul 2026 18:21:25 -0500
Subject: dt-bindings: iio: adc: Add burn-out current properties

Some ADCs incorporate burn-out current sources that provide current to
the channel's input pins for open-circuit or short-circuit detection.

Signed-off-by: Kurt Borja <kuurtb@gmail.com>
Acked-by: Conor Dooley <conor.dooley@microchip.com>
Signed-off-by: David Lechner (TI) <dlechner@baylibre.com>
Signed-off-by: Jonathan Cameron <jonathan.cameron@oss.qualcomm.com>
---
 Documentation/devicetree/bindings/iio/adc/adc.yaml | 5 +++++
 1 file changed, 5 insertions(+)

diff --git a/Documentation/devicetree/bindings/iio/adc/adc.yaml b/Documentation/devicetree/bindings/iio/adc/adc.yaml
index 9f7196d61ac3..e1da63119648 100644
--- a/Documentation/devicetree/bindings/iio/adc/adc.yaml
+++ b/Documentation/devicetree/bindings/iio/adc/adc.yaml
@@ -101,6 +101,11 @@ properties:
       sources. The index in the array corresponds to the same index in the
       excitation-channels array.
 
+  burn-out-current-nanoamp:
+    description:
+      Burn-out current sources provide current to the channel's input pins for
+      open-circuit or short-circuit detection.
+
 anyOf:
   - oneOf:
       - required:
-- 
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